Electron trapping in α-alumina observed by electron-induced X-ray emission

Journal of Applied Physics

Volumn 79, Issue 6, 1996, Pages 2909-2912

  Jonnard, P ^a   Vergand, F ^a   Kefi, M ^a   Bonnelle, C ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009803476     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361221     Document Type: Article

References (17)

1. A. M. Stoneham, Theory of Defects in Solids (Oxford University Press, New York. 1995), Chaps, 15-19.
2. J. H. Harding. Rep. Prog. Phys. 53, 1403 (1990).
3. J. H. Crawford, J. Nucl. Mater. 108&109, 644 (1982).
4. C. Bonnelle, Annual Report C, 201-272 (1987).
5. M. Kefi, P. Jonnard, F. Vergand, C. Bonnelle, and E. Gillet, J. Phys. Condens. Matter 5, 8629 (1993).
6. S. Ciraci and I. P. Batra. Phys. Rev. B 28, 982 (1983).
7. M. Kohyama, S. Kose, M. Kinoshita, and R. Yamamoto, J. Phys. Chem. Solids 53, 345 (1992).
8. M. Gautier, J. P. Duraud, L. Pham Van, and M. J. Guittet, Surf. Sci. 250, 71 (1991).
9. C. Bonnelle, F. Vergand, P. Jonnard, J.-M. André, P.-F. Staub, P. Avila, P. Chargelégue, M.-F. Fontaine, D. Laporte, P. Paquier, A. Ringuenet, and B. Rodriguez, J. Sci. Instrum. 65, 3466 (1994).
10. These values correspond to the thicknesses which contribute to 80% of the intensity in the studied line.
11. W. L. O'Brien, J. Jia, Q. Y. Dong, T. A. Calcott, K. E. Miyano, D. L. Ederer, D. R. Mueller, and C. C. Kao, Phys. Rev. B 47, 140 (1993).
12. J. Olivier and R. Poirier, Surf. Sci. 105, 347 (1981).
13. A. M. Stoneham, Rep. Prog. Phys. 44, 79 (1981).
14. A. Balzarotti and A. Bianconi, Phys. Status Solidi B 76, 689 (1976).
15. I. A. Brytov and Y. N. Romashchenko, Sov. Phys. Solid State 20, 384 (1978).
16. J. Nithianandam and S. E. Schnatterly, Phys. Rev. B 42, 3038 (1990).
17. F. Vergand, P. Jonnard, M. Kefi, C. Bonnelle, C, Deparis, and J. Massies, J. Phys.: Condens. Matter 5, 1691 (1993).