Study of underground imaging using shear waves: The stacking method of the reflected scattered wave

Archaeological Prospection

Volumn 7, Issue 4, 2000, Pages 249-261

  Sugimoto, Tsuneyoshi ^a   Saitou, Hiroki ^a   Okujima, Motoyoshi ^a  

^a TOIN UNIVERSITY OF YOKOHAMA   (Japan)

Author keywords

Geophysical exploration; Scattered wave; Shear wave; Stacking method; Underground imaging

Indexed keywords

EID: 0009792859     PISSN: 10752196     EISSN: 10990763     Source Type: Journal    
DOI: 10.1002/1099-0763(200012)7:4<249::AID-ARP155>3.3.CO;2-R     Document Type: Article

References (7)

1. Saitou H, Sugimoto T, Okujima M. 1996. Study of underground imaging using shear wave — Improvement of a resolution of an underground image. Proceedings of Autumn Meeting of The Acoustical Society of Japan, Supplement II 2-9-23; 981 – 982 (In Japanese).
2. Sugimoto T, Saitou H, Okujima M. 1995. Measurement of sound speed and attenuation of longitudinal and shear wave in underground. Proceedings of Autumn Meeting of The Acoustical Society of Japan, September 1995, Supplement II 3-8-13; 1065 – 1066 (In Japanese).
3. Sugimoto T, Saitou H, Okujima M. 1996. Study of underground imaging using shear wave-study on archeological prospection using sound wave. Proceedings of Spring Meeting of The Acoustical Society of Japan, March 1996, Supplement II 1-9-21; 923 – 924 (In Japanese).
4. Sugimoto T, Okujima M. 1996. Underground imaging using shear waves — stacking method of the reflected scattered waves. Journal of Japan Applied Physics 35: 3105–3108.
5. Sugimoto T, Saitou H, Okujima M. 1997. Study of underground imaging using shear wave — study on a signal processing method for precision improvement. Proceedings of Spring Meeting of The Acoustical Society of Japan, Supplement II 3-1-11; 1113 – 1114 (In Japanese).
6. Sugimoto T, Saitou H, Okujima M. 1997. Improvement of underground image — underground imaging using shear waves. Journal of Japan Applied Physics 36: 3197–3198.
7. Sutton JL. 1979. Underwater acoustic imaging. Proceedings of IEEE 67 (4): 554–566.