Wide range standard for scanning probe microscopy height calibration

Review of Scientific Instruments

Volumn 67, Issue 12, 1996, Pages 4198-4200

  Brodowsky, Hanna M ^a   Boehnke, Undine C ^a   Kremer, Friedrich ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009737299     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147569     Document Type: Article

References (10)

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