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Volumn 14, Issue 3, 1996, Pages 977-983
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Feature scale simulation studies of TEOS-sourced remote microwave plasma-enhanced chemical vapor deposition of silicon dioxide: Role of oxygen atom recombination
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0009719929
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.580066 Document Type: Article |
Times cited : (13)
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References (19)
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