Characterization of epitaxixally grown Fe-N films by sputter beam method

Journal of Applied Physics

Volumn 79, Issue 3, 1996, Pages 1678-1683

  Okamoto, Satoshi ^a   Kitakami, Osamu ^a   Shimada, Yutaka ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009714487     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361421     Document Type: Article

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