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Volumn 80, Issue 4, 1996, Pages 2169-2174

Li diffusion in Ti oxyfluoride films: Thermal activation energy and jump length derived from impedance spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0009571093     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363108     Document Type: Article
Times cited : (13)

References (34)
  • 20
    • 85033845180 scopus 로고    scopus 로고
    • note
    • Scribner Associates, Inc., Virginia, ZVIEW FOR WINDOWS (1994). The equivalent circuit part of the program is based on the LEVM 6.0 program written by J. R. Macdonald. In the fitting, each data point's weight is normalized by its magnitude. The fits were carried out with complex nonlinear least squares.
  • 22
    • 5344251867 scopus 로고
    • edited by P. G. Bruce Cam1ridge University Press, Cambridge, Chap. 8
    • W. Weppoer, in Solid State Electrochemistry, edited by P. G. Bruce (Cam1ridge University Press, Cambridge, 1995), Chap. 8.
    • (1995) Solid State Electrochemistry
    • Weppoer, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.