Analysis of a fast crystalline-state reaction by a new diffractometer designed for rapid data collection

Journal of Molecular Structure

Volumn 374, Issue 1-3, 1996, Pages 37-42

  Ohashi, Yuji ^a   Uekusa, Hidehiro ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009533647     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-2860(95)08926-8     Document Type: Article

References (9)

1. G.M. Sheldrick, SHELXL-93, University of Göttingen, Germany, 1993;
2. SHELXS-86, Acta Crystallogr., Sect. A, 46 (1990) 467.
3. E. Egert and G.M. Sheldrick, PATSEE, Acta Crystallogr., Sect. A, 41 (1985) 262.
4. A. Altomare, G. Cascarano, C. Giacovazzo, A. Guagliardi, M.C. Burla, G. Polidori and M. Camalli, SIR92, J. Appl. Crystallogr., 27 (1994) 435.
5. Molecular Structure Corporation, TEXSAN Crystal Structure Analysis Package, Molecular Structure Corporation, The Woodlands, TX 77 381, USA, 1985 and 1992.
6. J. Miyahara, K. Takahashi, Y. Amemiya, N. Kamiya and Y. Satow, Nucl. Instr. Mech. A, 246 (1986) 572.
7. N. Kamiya, I. Tanaka and H. Iwasaki, in Y. Ohashi (Ed.), Reaction in Molecular Crystals, VCH, Weinheim, 1993.
8. A Mori, N. Kato, H. Takeshita, Y. Kurihara and M. Ito, J. Chem. Soc. Chem. Commun., (1994) 869.
9. Y. Ohashi, Ace. Chem. Res., 21 (1988) 268.