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Volumn 44, Issue 8, 2001, Pages 76-82

A process control approach to cyber attack detection

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0009516633     PISSN: 00010782     EISSN: None     Source Type: Journal    
DOI: 10.1145/381641.381662     Document Type: Article
Times cited : (36)

References (5)
  • 3
    • 0009361012 scopus 로고    scopus 로고
    • A hierarchy of system-oriented knowledge for diagnosis of manufacturing system faults
    • Feb.
    • Ye, N. A hierarchy of system-oriented knowledge for diagnosis of manufacturing system faults. Information and System Engineering 2, 2 (Feb. 1996), 79-103.
    • (1996) Information and System Engineering 2 , vol.2 , pp. 79-103
    • Ye, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.