Narrow bandpass multilayer x-ray monochromator

Review of Scientific Instruments

Volumn 68, Issue 8, 1997, Pages 2969-2972

  Sammar, A ^a   Krastev, K ^a   Andre J M ^a   Barchewitz, R ^a   Rivoira, R ^b  

^a SORBONNE UNIVERSITÉ   (France)

^b AIX MARSEILLE UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009503573     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148228     Document Type: Article

References (6)

1. E. Spiller, Soft X-Ray Optics (SPIE Optical Engineering. Bellingham).
2. H. Berrouane, J.-M. André. R. Barchewitz, T. Moreno, A. Sammar, C. Khan Malek, B. Pardo, and R. Rivoira, Nucl. Instrum. Methods Phys. Res. A 312, 512 (1992).
3. A. Sammar, J.-M. André, and B. Pardo, Opt. Commun. 86, 245 (1991).
4. K. Krastev, J.-M. André, and R. Barchewitz, J. Opt. Soc. Am. A 13, 2027 (1996).
5. M. Arbaoui, J.-M. André. P. Couillaux, and R. Barchewitz, Rev. Sci. Instrum. 56, 2055 (1985).
6. C. Guichet, R. Rivoira, G. Rasigni, J.-M. André, and R. Barchewitz, J. X-Ray Sci. Technology (in press).