Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 2, Issue 1-4, 1998, Pages 789-793

  Darhuber, A A ^a   Holy, V ^a,e   Schittenhelm, P ^b   Stangl, J ^a   Kegel, I ^c   Kovats, Z ^c   Metzger, T H ^c   Bauer, G ^a   Abstreitet, G ^b   Grubel G ^d  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b WALTER SCHOTTKY INSTITUT   (Germany)

^c UNIVERSITY OF MUNICH   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e MASARYK UNIVERSITY   (Czech Republic)

Author keywords

Grazing incidence diffraction; Reciprocal space maps; Self organization; X ray diffraction

Indexed keywords

EID: 0009494721     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(98)00161-1     Document Type: Article

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