Oblique roughness replication in strained SiGe/Si multilayers

Physical Review B - Condensed Matter and Materials Physics

Volumn 57, Issue 19, 1998, Pages 12435-12442

  Holy V ^a   Darhuber, A ^b   Stangl, J ^b   Bauer, G ^b  

^a MASARYK UNIVERSITY   (Czech Republic)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009465895     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.12435     Document Type: Article

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