Characterization of interface structures in nanocrystalline germanium by means of high-resolution electron microscopy and molecular dynamics simulations

Zeitschrift fur Kristallographie

Volumn 211, Issue 3, 1996, Pages 147-152

  Neumann, W ^a   Hofmeister, H ^a   Conrad, D ^a   Scheerschmidt, K ^a   Ruvimov, S ^a,b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

High resolution electron microscopy; Interfaces; Molecular dynamics simulations; Nanocrystals

Indexed keywords

EID: 0009429009     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (18)

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