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Volumn 13, Issue 4, 1994, Pages 599-607

A new approach of the box method adapted to any convex polygonal mesh

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0009352673     PISSN: 03321649     EISSN: None     Source Type: Journal    
DOI: 10.1108/eb051879     Document Type: Review
Times cited : (2)

References (5)
  • 1
    • 25644449059 scopus 로고
    • Transient Simulation of Heterostructures
    • J.J.H. Miller (Ed.), Boole Press, Dublin
    • J.E. Viallet and S. Mottet, “Transient Simulation of Heterostructures,” NASECODE IV Conf., J.J.H. Miller (Ed.), Boole Press, Dublin, pp. 536–542, 1985.
    • (1985) NASECODE IV Conf. , pp. 536-542
    • Viallet, J.E.1    Mottet, S.2
  • 2
    • 0003497098 scopus 로고
    • Analysis and Simulation of Semiconductor Devices
    • Springer-Verlag, Wien, New-York
    • S. Selberherr, “Analysis and Simulation of Semiconductor Devices,” Springer-Verlag, Wien, New-York (1983)
    • (1983)
    • Selberherr, S.1
  • 3
    • 84951545229 scopus 로고
    • Autoadaptive Mesh Refinement
    • W. Fichtner and D. Aemmer (Ed.), Hartung-Gorre
    • C. Simon, S. Mottet and J.E. Viallet, “Autoadaptive Mesh Refinement”, SISDEP 1991, Vol. 4, W. Fichtner and D. Aemmer (Ed.), Hartung-Gorre, pp. 225–233, 1991.
    • (1991) SISDEP , vol.4 , pp. 225-233
    • Simon, C.1    Mottet, S.2    Viallet, J.E.3
  • 4
    • 0020180739 scopus 로고
    • Finite Boxes - A generalisation of the finite difference method suitable for semiconductor device simulation
    • A.F. Franz and al. “Finite Boxes - A generalisation of the finite difference method suitable for semiconductor device simulation” IEEE Trans. ED, Vol. ED 30, No 9, pp 1070–1082 (1983)
    • (1983) IEEE Trans. ED , vol.ED 30 , Issue.9 , pp. 1070-1082
    • Franz, A.F.1
  • 5
    • 28444484250 scopus 로고
    • #D Grid Generation for Semiconductor Devices Using a Fully Flexible refinement Approach
    • Springer New-York
    • N. Hitschfeld and W. Fichner, “#D Grid Generation for Semiconductor Devices Using a Fully Flexible refinement Approach,” SISDEP Vol. 5, Springer -Verlag, Wien, New-York, pp. 413–416, (1993)
    • (1993) SISDEP , vol.5 , pp. 413-416
    • Hitschfeld, N.1    Fichner, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.