Performance issues for iterative solvers in device simulation

SIAM Journal on Scientific Computing

Volumn 17, Issue 1, 1996, Pages 100-117

  Fan, Qing ^a   Forsyth, P A ^a   Mcmacken, J R F ^b   Tang, Wei Pai ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

^b Goal Electronics Inc   (Canada)

Author keywords

Device simulation; Drop tolerance; Fill level; Iterative solver; Ordering; Preconditioning

Indexed keywords

EID: 0009239767     PISSN: 10648275     EISSN: None     Source Type: Journal    
DOI: 10.1137/0917009     Document Type: Article

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