Dielectric response of a nondegenerate electron gas in semiconductor nanocrystallites

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 23, 1998, Pages 15729-15735

  van Faassen, E ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009201589     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.15729     Document Type: Article

References (34)

1. A. G. Cullis and L. T. Canham, Nature (London) 353, 335 (1991).
2. C. Delerue, G. Allan, and M. Lannoo, Phys. Rev. B 48, 11 024 (1993).
3. Dielectric Properties of Heterogeneous Materials, edited by A. Priou (Elsevier, New York, 1992).
4. A. Henglein, Chem. Rev. 89, 1861 (1989).
5. L. Brus, Appl. Phys. A: Solids Surf. 53, 465 (1991).
6. A. Read, R. Needs, J. Nash, L. Canham, P. Calcott, and A. Otesh, Phys. Rev. Lett. 69, 1232 (1992).
7. B. K. Ridley, Quantum Processes in Semiconductors (Clarendon, Oxford, 1993).
8. H. Weller, Adv. Mater. 5, 88 (1993).
9. M. Lannoo, C. Delerue, and G. Allan, Phys. Rev. Lett. 74, 3415 (1995).
10. A. Hagfeldt and M. Grätzel, Chem. Rev. 95, 49 (1995).
11. B. H. Erné, D. Vanmaekelbergh, and J. Kelly, Adv. Mater. 7, 739 (1995).
12. J. Orton and M. Powell, Rep. Prog. Phys. 43, 81 (1980).
13. Transport, Correlation and Structure Defects, edited by H. Fritzsche (World Scientific, Singapore, 1990).
14. A. Henglein, Top. Curr. Chem. 143, 113 (1988).
15. J. Perenboom, P. Wyder, and F. Meier, Phys. Rep. 78, 173 (1981).
16. F. Bloch, Z. Phys. 81, 363 (1933).
17. See, e.g., B. Deb and S. Ghosh, The Single Particle Density in Physics and Chemistry, edited by N. March and B. Deb (Academic, London, 1987), Chap. 8.
18. V. Kresin, Phys. Rep. 220, 1 (1992).
19. M. Brack, Rev. Mod. Phys. 65, 677 (1993).
20. L. Féret et. al J. Phys. B 29, 4477 (1996).
21. A. Domps, P. Reinhard, and E. Suraud, Phys. Rev. Lett. 80, 5520 (1998).
22. G. Mie, Ann. Phys. (Leipzig) 25, 377 (1908).
23. See, e.g., H. van de Hulst, Light Scattering by Small Particles (Wiley, New York, 1957).
24. A. P. van Gelder, J. Holvast, J. Stoelinga, and P. Wyder, J. Phys. C 4, 2757 (1972).
25. H. M. Altschuler, in Handbook of Microwave Measurements, edited by M. Sucher and J. Fox (Wiley, New York, 1963), Vol. II.
26. D. Bergman and D. Stroud, in Solid State Physics, edited by H. Ehrenreich and D. Turnbull (Academic, Boston, 1992), Vol. 46.
27. W. Lubberhuizen (private communication). The determination was done by loading an X-band microwave cavity with a small piece of porous GaP and analyzing the effect on the resonance frequency and width.
28. J. Warman, M. de Haas, M. Grätzel, and P. Infelta, Nature (London) 310, 306 (1984).
29. K. Schindler and M. Kunst, J. Phys. Chem. 94, 822 (1990).
30. S. Martin, H. Herrmann, and M. Hoffmann, J. Chem. Soc., Faraday Trans. 90, 3315 (1994).
31. J. Chem. Soc., Faraday Trans.S. MartinH. HerrmannM. Hoffmann90, 3323 (1994).
32. P. Hohenberg and W. Kohn, Phys. Rev. 136, B864 (1964).
33. H. K. Henisch, Semiconductor Contacts (Clarendon, Oxford, 1985).
34. R. Ruppin, J. Opt. Soc. Am. 66, 449 (1976).