On the current enhancement at the edge of a crack in a lattice of resistors

Advances in Applied Probability

Volumn 30, Issue 2, 1998, Pages 342-364

  Taylor, Howard M ^a   Sweitzer, Dennis E ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

Current enhancement; Random fuse model; Random walk

Indexed keywords

EID: 0009177393     PISSN: 00018678     EISSN: None     Source Type: Journal    
DOI: 10.1017/S0001867800047327     Document Type: Article

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