Ni/Si based multilayer for the reflection of soft x rays in the "water window"

Journal of Applied Physics

Volumn 82, Issue 9, 1997, Pages 4137-4142

  Cilia, M ^a,b   Verhoeven, J ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009148348     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366213     Document Type: Article

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