Length, scaling, and material dependence of crosstalk between distributed RC interconnects

Proceedings of the IEEE 1999 International Interconnect Technology Conference, IITC 1999

Volumn , Issue , 1999, Pages 227-229

  Davis, Jeff A ^a   Meindl, James D ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS PROPERTIES; TRANSIENT ANALYSIS;

DISTRIBUTED RC; GENERAL EXPRESSION; INTERCONNECT CIRCUITS; RISETIMES; SOURCE IMPEDANCE; STRONG DEPENDENCES; VOLTAGE SOURCE;

CROSSTALK;

EID: 0009056888     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IITC.1999.787129     Document Type: Conference Paper

References (1)

1. T. Sakurai, "Closed-Form Expression for Interconnection Delay, Coupling, and Crosstalk in VLSI's", IEEE Transaction of Electron Devices, Vol. 40, no. 1, pp. 118-124, January 1993.