Single-electron charging of a molecule observed in scanning tunneling scattering experiments

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 4, 1996, Pages 2399-2402

  Nejo, H ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009032204     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588868     Document Type: Article

References (11)

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4. H. Nejoh, S. Watanabe, M. Nakamura, and M. Aono, in Proceedings of the 3rd International Conference on High Technology, Chiba, 1992 (unpublished), p. 115.
5. A. A. Zubilov et al., JETP Lett. 20, 41 (1994).
6. C. M. Fisher, M. Burghard, S. Roth, and K. von Klitzing, Europhys. Lett. 28, 129 (1994).
7. K. K. Likharev, IBM J. Res. Dev. 32, 144 (1988).
8. M. J. Fish et al., GAUSSIAN 90 (Carnegie-Mellon Quantum Chemistry Publishing Unit, Pittsburgh, PA).
9. S. Ichimaru, Rev. Mod. Phys. 54, 1017 (1982).
10. D. G. Baksheyev and V. A. Tkachenko, in Proceedings of the Second International Conference NANO-II, Moscow, August, 1993
11. [Herald of Russian Acad. Technol. Sci. 1, 723 (1994)].