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Below the so-called Lifshitz point the system has an additional destabilizing mechanism supporting the rotation, namely, uncompensated torque on the director. For more details, see, e.g., A. Hertrich, W. Decker, W. Pesch, and L. Kramer, J. Phys. II 2, 1915 (1992).
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this case (Formula presented) should stand for the linear rotation velocity and depend on the distance between the observation point and the rotation center
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In this case (Formula presented) should stand for the linear rotation velocity and depend on the distance between the observation point and the rotation center.
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85037205950
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It means we neglect defect generation, since A must vanish in the defect cores. The neglect would be erroneous for the planar alignment, when orientation of convective rolls is fixed by boundary conditions and the defect generation is an important mechanism for transition to chaos (the so-called defect-mediated turbulence) 7. On the contrary, the problem under consideration has an additional degree of freedom to make the pattern chaotic, viz., the mentioned undamped rotations of its different fragments with respect to each other. Regarding the defect generation, for point defects it is suppressed due to smallness of (Formula presented) 2 3. As for dislocation lines, which may arise at boundaries of the different pattern’s fragments, their quantitative measure is the ratio (Formula presented) which vanishes at (Formula presented) tending to zero. Thus, both the point and the line defects should not affect statistical properties of the pattern at small (Formula presented)
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It means we neglect defect generation, since A must vanish in the defect cores. The neglect would be erroneous for the planar alignment, when orientation of convective rolls is fixed by boundary conditions and the defect generation is an important mechanism for transition to chaos (the so-called defect-mediated turbulence) 7. On the contrary, the problem under consideration has an additional degree of freedom to make the pattern chaotic, viz., the mentioned undamped rotations of its different fragments with respect to each other. Regarding the defect generation, for point defects it is suppressed due to smallness of (Formula presented) 23. As for dislocation lines, which may arise at boundaries of the different pattern’s fragments, their quantitative measure is the ratio (Formula presented) which vanishes at (Formula presented) tending to zero. Thus, both the point and the line defects should not affect statistical properties of the pattern at small (Formula presented)
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