|
Volumn 49, Issue 16, 1986, Pages 1025-1027
|
Determination of gap state density in polycrystalline silicon by field-effect conductance
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0008957105
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.97460 Document Type: Article |
Times cited : (179)
|
References (18)
|