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Volumn 102, Issue 2, 1997, Pages 157-161

How to measure diffusion constant and absolute susceptibility of charge carriers at the same time

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0008892445     PISSN: 07223277     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002570050276     Document Type: Article
Times cited : (3)

References (18)
  • 12
    • 85033528227 scopus 로고
    • Ph. D. Thesis, Universität Karlsruhe (TH)
    • Ruf, R.: Ph. D. Thesis, Universität Karlsruhe (TH), (1994)
    • (1994)
    • Ruf, R.1
  • 16
    • 85033534938 scopus 로고
    • Ph. D. Thesis, Universität Bayreuth
    • Stöcklein, W.: Ph. D. Thesis, Universität Bayreuth, 1985
    • (1985)
    • Stöcklein, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.