Surface effects on current mechanisms in 6H-SiC n+pp+ structures passivated with a deposited oxide

Journal of Applied Physics

Volumn 84, Issue 3, 1998, Pages 1688-1692

  Ortolland, S ^a   Raynaud, C ^a   Locatelli, M L ^a   Chante, J P ^a   Senes, A ^a,b  

^a CNRS   (France)

^b SCHNEIDER ELECTRIC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008862126     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368237     Document Type: Article

References (16)

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