SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Applied Physics

Volumn 63, Issue 9, 1988, Pages 4440-4443

Analysis of plate and colony precipitates decorating stacking faults in a single-crystal silicon

(3) Ryoo, K a Drosd, R b Wood, W c

a Wacker Siltronic Corp (United States)

b Bipolar Integrated Technology Inc ^* (United States)

c OREGON HEALTH AND SCIENCE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008852255 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.340163 Document Type: Article

Times cited : (27)

References (12)

1
- 0022956527
- (1986) Mater. Res. Soc. Symp. Proc , vol.62 , pp. 17
- Ryoo, K.¹ Drosd, R.² Wood, W.³

2
- 84950764292
- (1977) J. Electrochem. Soc , vol.124 , pp. 1757
- Wright Jenkins, M.¹

3
- 0343018371
- (1985) Bull. Electron Microsc. Soc. Am , vol.15 , pp. 67
- Zaluzec, N.J.¹

4
- 33846950724
- (Springer, Berlin)
- (1982) Czochralski-Grown Silicon
- Zulehner, W.¹ Huber, D.²

5
- 84950770354
- (1982) Crystal , vol.8

6
- 0003693963
- (Oxford University Press, New York).
- (1981) Experimental High-Resolution Electron Microscopy
- Speoce, J.C.H.¹

7
- 0015655061
- (1973) J. Appl. Phys , vol.44 , pp. 3682
- Nes, E.¹ Washburn, J.²

8
- 0015671458
- (1973) J. Appl. Phys , vol.44 , pp. 4459
- Das, G.¹

9
- 0020902804
- Proceedings of the Electrochemical Society (Electrochemical Society, Pennington, New Jersey).
- (1983) Defects in Silicon , pp. 463
- Lunnon, M.¹ Allison, D.F.² Stacy, W.T.³

10
- 3042984873
- Proceedings of the Electrochemical Society (Electrochemical Society, Pennington, New Jersey), Vol344.
- (1981) Semiconductor Silicon
- Stacy, W.T.¹ Allison, D.F.² Wu, T.C.³

11
- 0020822243
- (1983) J. Electrochem. Soc , vol.130 , pp. 1878
- Lin, P.S.D.¹ Marcus, R.B.² Sheng, T.T.³

12
- 0021292280
- (1984) Mater. Res. Soc. Symp. Proc , vol.25 , pp. 405
- Gibson, J.M.¹ Tung, R.T.² Phillips, J.M.³ Poate, J.M.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.