Growth and characterization of n-type GaAs/AlGaAs quantum well infrared photodetector on GaAs-on-Si substrate

Journal of Electronic Materials

Volumn 27, Issue 7, 1998, Pages 858-865

  Sengupta, D K ^a,c   Weisman, M B ^b   Feng, M ^a   Chuang, S L ^a   Chang, Y C ^b   Cooper, L ^b   Adesida, I ^a   Bloom, I ^b,f   Hsieh, K C ^a   Fang, W ^a   Malin, J I ^a,g   Curtis, A P ^a   Horton, T ^a,h   Stillman, G E ^a   Gunapala, S D ^c   Bandara, S V ^c   Pool, F ^c   Liu, J K ^c   Mckelvey, M ^c   Luong, E ^c   Hong, W ^c   Mumolo, J ^c   Liu, H C ^d   Wang, W I ^e   more..

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b United States of America   (United States)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^d NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^e Department of Earth and Environmental Sciences   (United States)

^f TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^g TEXAS INSTRUMENTS   (United States)

^h Uniphase Telecommunications Products   (United States)

Author keywords

Dark current characteristics; Peak response wavelength; Quantum efficiency; Quantum well infrared photodetectors (QWIPs); Rapid thermal annealing

Indexed keywords

EID: 0008812328     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-998-0110-7     Document Type: Article

References (24)

1. M. Akiyama, Y. Kawarada, S. Nishi, T. Ueda and K. Kaminishi, Mater. Res. Soc. Symp. Proc. 67, (Pittsburgh, PA: Mater. Res. Soc., 1986), p. 53.
2. H. Schichijo, L. Tran, R. Matyi and L. Lee, Mater. Res. Soc. Symp. Proc. 91, (Pittsburgh, PA: Mater. Res. Soc., 1987), p. 201.
3. C. Ito, M. Feng, V.K. Eu and H.B. Kim, Mater. Res. Soc. Symp. Proc. 67, (Pittsburgh, PA: Mater. Res. Soc., 1986), p. 197.
4. B.F. Levine, J. Appl. Phys. 74, R1 (1993).
5. S.D. Gunapala, B.F. Levine, D. Ritter, R. Hamm and M.B. Panish, Appl. Phys. Lett. 58, 2024 (1991).
6. J.Y. Anderson, L. Lundqvist, Z.F. Paska, K. Streubel and J.J. Wallin, Proc. SPIE 1762, (SPIE, 1992), p. 216.
7. H.C. Liu, J.R. Thompson, J. Li, Z.K. Wasilewski, M. Buchanan and J.G. Simmons, IEEE Electron Device Lett. 14, 566 (1993).
8. K.K. Choi, L. Fotiadis, M. Taysing-Lara, W. Chang and G.J. Iafrate, Appl. Phys. Lett. 58, 2234 (1991).
9. H. Schenieder, F. Fuchs, B. Dischler, J.D. Ralston and P. Koidl, Appl. Phys. Lett. 58, 2234 (1991).
10. K.L. Tsai, K.H. Chang, C.P. Lee, K.F. Huang, J.S. Tsang and H.R. Chen, Appl. Phys. Lett. 62, 3504 (1993).
11. I. Grave, A. Shakouri, N. Kuze and A. Yariv, Appl. Phys. Lett. 60, 2362 (1992).
12. E. Martinet, E. Rosencher, F. Luc, Ph. Bois, E. Costard and S. Delaitre, Appl. Phys. Lett. 61, 246 (1992).
13. D.D. Yang, F.H. Julien, P. Boucaud, J.M. Lourtioz and R. Planel, IEEE Photonics Technol. Lett. PL-2, 181 (1990).
14. M.S. Kiledjian, J.N. Schulman and K.L. Wang, Phy. Rev. B 44, 5616 (1991).
15. E.R. Brown, F.W. Smith, G.W. Turner, K.A. McIntosh and M.J. Manfra, Proc. SPIE 1735, 228 (1992).
16. C.G. Bethea, B.F. Levine, V.O. Shen, R.R. Abbott and S.J. Hseih, IEEE Trans. Electron Dev. 38, 1118 (1991).
17. L.J. Kozlowski, G.M. Willams, G.J. Sullivan, C.W. Farley, R.J. Anderson, J. Chen, D.T. Cheng, W.E. Tennant and R.E. DeWames, IEEE Trans. Electron Dev. 38, 1118 (1991).
18. C.G. Bethea, B.F. Levine, M.T. Asom, R.E. Leibenguth, J.W. Stayt, K.G. Glogovsky, R.A. Morgon, J.D. Blackwell and W.J. Parish, IEEE Trans. Electron Dev. 40, 1957 (1993).
19. W. Lu, H.J. Ou, M.H. Chen, X.L. Huang, S.C. Shen, R.H. Gu and L.B. Ye, Intl. J. Infrared Millim. Waves 15, 137 (1994).
20. S.D. Gunapala, S.V. Bandara, J.K. Liu, W. Hong, E.M. Luong, J.M. Mumolo, M.J. McKelvey, D.K. Sengupta, A. Singh, C.A. Shott, R. Carolejo, P.D. Maker, J.J. Bock, M.E. Ressler, M.W. Werner and T. Krabach, Proc. SPIE 3379, 44 (1998).
21. H.C. Liu, Z.R. Wasilewski, M. Buchanan and H. Chu, Appl. Phys. Lett. 63, 761 (1993).
22. S.L. Chuang, Physics of Optoelectronic Devices (New York: Wiley, 1995).
23. K.T. Kim, S.S. Lee and S.L. Chuang, J. Appl. Phys. 69, 6617 (1991).
24. E. Rosencher, E. Martinet, F. Luc, Ph. Bois and E. Bockenhoff, Appl. Phys. Lett. 59, 3255 (1993).