On the impact of electron spectroscopies (versus optical techniques) to study organized organic layers and their interfaces

Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 855-860

  Magnee R ^a   Mekhalif, Z ^a   Doneux, C ^a   Duwez, A S ^a   Gregoire, C ^a   Riga, J ^a   Delhalle, J ^a   Pireaux, J J ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

HREELS; IRAS; Organic layer; Polymer; Structure; XPS

Indexed keywords

EID: 0008809192     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00170-9     Document Type: Article

References (22)

1. P.J. Schmitz, J.W. Holubka, S. Srinivasan, in: L.T. Drzal, H.P. Schreißer (Eds.), Proceedings of The Adhesion Society 20th Anniversary Meeting, Hilton Head Island, SC, 23-26 February 1997.
2. J.J. Pireaux, J. Riga, P. Boulanger, P. Snauwaert, Y. Novis, M. Chtaib, C. Gregoire, F. Fally, E. Beelen, R. Caudano, J. Verbist, J. Electr. Spectrosc. 52 (1990) 423; A.S. Duwez, J. Riga, J. Ghijsen, J.J. Pireaux, J. Verbist, J. Delhalle, J. Electr. Spectrosc. 76 (1995) 523; A.S. Duwez, S. Di Paolo, J. Ghijsen, J. Riga, M. Deleuze, J. Delhalle, J. Phys. Chem. B 101 (1997) 884.
3. J.J. Pireaux, J. Riga, P. Boulanger, P. Snauwaert, Y. Novis, M. Chtaib, C. Gregoire, F. Fally, E. Beelen, R. Caudano, J. Verbist, J. Electr. Spectrosc. 52 (1990) 423; A.S. Duwez, J. Riga, J. Ghijsen, J.J. Pireaux, J. Verbist, J. Delhalle, J. Electr. Spectrosc. 76 (1995) 523; A.S. Duwez, S. Di Paolo, J. Ghijsen, J. Riga, M. Deleuze, J. Delhalle, J. Phys. Chem. B 101 (1997) 884.
4. J.J. Pireaux, J. Riga, P. Boulanger, P. Snauwaert, Y. Novis, M. Chtaib, C. Gregoire, F. Fally, E. Beelen, R. Caudano, J. Verbist, J. Electr. Spectrosc. 52 (1990) 423; A.S. Duwez, J. Riga, J. Ghijsen, J.J. Pireaux, J. Verbist, J. Delhalle, J. Electr. Spectrosc. 76 (1995) 523; A.S. Duwez, S. Di Paolo, J. Ghijsen, J. Riga, M. Deleuze, J. Delhalle, J. Phys. Chem. B 101 (1997) 884.
5. J.J. Pireaux, B. Heens, C. Gregoire, P.A. Cornelio, J.A. Gardella Jr, Appl. Surf. Sci. 47 (1991) 163; G. Leclerc, J.J. Pireaux, D. Tremblay, R. Caudano, C. Hönings, U. Schumacher-Hamedat, H. Höcker, J. Chem. Phys. 101 (1994) 781; G. Leclerc, J.J. Pireaux, R. Caudano, Ch. H önings, H. Höcker, J. Chem. Phys. 103 (1995) 7605.
6. J.J. Pireaux, B. Heens, C. Gregoire, P.A. Cornelio, J.A. Gardella Jr, Appl. Surf. Sci. 47 (1991) 163; G. Leclerc, J.J. Pireaux, D. Tremblay, R. Caudano, C. Hönings, U. Schumacher-Hamedat, H. Höcker, J. Chem. Phys. 101 (1994) 781; G. Leclerc, J.J. Pireaux, R. Caudano, Ch. H önings, H. Höcker, J. Chem. Phys. 103 (1995) 7605.
7. J.J. Pireaux, B. Heens, C. Gregoire, P.A. Cornelio, J.A. Gardella Jr, Appl. Surf. Sci. 47 (1991) 163; G. Leclerc, J.J. Pireaux, D. Tremblay, R. Caudano, C. Hönings, U. Schumacher-Hamedat, H. Höcker, J. Chem. Phys. 101 (1994) 781; G. Leclerc, J.J. Pireaux, R. Caudano, Ch. H önings, H. Höcker, J. Chem. Phys. 103 (1995) 7605.
8. N. Ueno, J. Electr. Spectrosc. 78 (1996) 345; K. Seki, 7th International Conference on Electron Spectroscopy, Chiba, 1997, 31-2 these conference proceedings; A. Koma, Prog. Crystal Growth Charact. 30 (1995) 129.
9. N. Ueno, J. Electr. Spectrosc. 78 (1996) 345; K. Seki, 7th International Conference on Electron Spectroscopy, Chiba, 1997, 31-2 these conference proceedings; A. Koma, Prog. Crystal Growth Charact. 30 (1995) 129.
10. N. Ueno, J. Electr. Spectrosc. 78 (1996) 345; K. Seki, 7th International Conference on Electron Spectroscopy, Chiba, 1997, 31-2 these conference proceedings; A. Koma, Prog. Crystal Growth Charact. 30 (1995) 129.
11. G. Gensterblum, J. Electr. Spectrosc. 81 (1996) 89.
12. B.Y. Han, K. Hevesi, L.M. Yu, G. Gensterblum, J.J. Pireaux, P.A. Thiry, R. Caudano, J. Vac. Sci. Technol. A13 (1995) 1036; K. Hevesi, P. Rudolf, L.M. Yu, J.J. Pireaux, D. Bernaerts, G. Van Tendeloo, S. Amelinckx, N. Zema, M. Pedio, submitted for publication.
13. B.Y. Han, K. Hevesi, L.M. Yu, G. Gensterblum, J.J. Pireaux, P.A. Thiry, R. Caudano, J. Vac. Sci. Technol. A13 (1995) 1036; K. Hevesi, P. Rudolf, L.M. Yu, J.J. Pireaux, D. Bernaerts, G. Van Tendeloo, S. Amelinckx, N. Zema, M. Pedio, submitted for publication.
14. K. Hevesi, Ph.D. Thesis, Namur, 1998.
15. Z. Mekhalif, J. Riga, J.J. Pireaux, J. Delhalle, Langmuir 13 (1997) 2285.
16. Z. Mekhalif, J. Delhalle, J.J. Pireaux, 44th AVS Symposium, San Jose, CA, 20-24 October 1997.
17. G. Ertl, J. Küppers, in: Low Energy Electrons and Surface Chemistry, Verlag Chemie, Weinheim 1974.
18. R. Magnée, C. Doneux, F. Bodino, P. Rudolf, J.J. Pireaux, M. Maazouz, D. Teillet-Billy, submitted for publication.
19. J.J. Pireaux, G. Gensterblum, C. Gregoire, B.Y. Han, K. Hevesi, C.A. Fustin, P. Rudolf, L.M. Yu, R. Caudano, D.A. Leigh, F. Zerbetto, in: P.N. Prasad, J.E. Mark, S.H. Kandil, Z. Kafafi (Eds.), Proceedings of 4th International Conference on Frontiers of Polymers and Advanced Materials, Plenum Publishing Corp., in press.
20. A.-S. Duwez, Ph.D. Thesis, Namur, November 1997.
21. J.J. Pireaux, in: L. Sabbatini, P.G. Zambonin (Eds.), Surface Characterization of Advanced Polymers, VCH, Manheim, 1993, p. 47.
22. C. Gregoire, L.M. Yu, F. Bodino, M. Tronc J.J. Pireaux, submitted for publication.