Lower bounds for fully dynamic connectivity problems in graphs

Algorithmica (New York)

Volumn 22, Issue 3, 1998, Pages 351-362

  Henzinger, M R ^a   Fredman, M L ^b  

^a HEWLETT PACKARD COMPANY   (United States)

^b RUTGERS UNIVERSITY   (United States)

Author keywords

Cell probe model; Dynamic connectivity testing; Dynamic planarity testing; Lower bounds

Indexed keywords

EID: 0008802771     PISSN: 01784617     EISSN: None     Source Type: Journal    
DOI: 10.1007/PL00009228     Document Type: Article

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