N,N′-Diphenylbenzamidinium nitrate

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 9, 1999, Pages 1583-1585

  Barker, James ^a   Errington, William ^b   Wallbridge, Malcolm G H ^b  

^a Innospec Limited   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008791932     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199007672     Document Type: Article

References (15)

1. Alcock, N. W., Barker, J. & Kilner, M. (1988). Acta Cryst. C44, 712-715.
2. Allen, F. H. & Kennard, O. (1993). Chem. Des. Autom. News, 8, 31-37.
3. Barker, J., Blacker, N. C., Phillips, P. R., Alcock, N. W., Errington, W. & Wallbridge, M. G. H. (1996). J. Chem. Soc. Dalton Trans. pp. 431-437.
4. Bondi, A. (1964). J. Phys. Chem. 68, 441-451.
5. Bradley, F. C., Frost, D. T. & Giandomenico, M. (1992). Can. Patent 2 068 744.
6. Caron, A. & Donohue, J. (1969). Acta Cryst. B25, 404.
7. Fimiani, V., Ainis, T., Cavellero, A. & Piraino, P. (1990). J. Chemother. 2, 319-326.
8. Fletcher, D. A., McMeeking, R. F. & Parkin, D. (1996). J. Chem. Inf. Comput. Sci. 36, 746-749.
9. Krechl, J., Bohm, S., Smrckova, S. & Kuthan, J. (1989). Collect. Czech. Chem. Commun. 54, 673-683.
10. Sheldrick, G. M. (1994). SHELXTL/PC. Version 5.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
11. Sheldrick, G. M. (1997). SHELXL97. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
12. Siemens (1994). SMART Software Reference Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
13. Siemens (1995). SAINT. Version 4.021. Data Integration Software. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
14. Wulff, G., Gross, T. & Schonfeld, R. (1997). Angew. Chem. Int. Ed. Engl. 36, 1962-1964.
15. Wulff, G. & Schonfeld, R. (1998). Adv. Mater. 10, 957-959.