(Acetonitrile-N)(η4-2-methylbuta-1,3-diene)(η 5-pentamethylcyclopentadienyl)-ruthenium(II) trifluoromethanesulfonate

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 12, 1999, Pages 2053-2055

  Gemel, Christian ^a   Kirchner, Karl ^a   Schmid, Roland ^a   Mereiter, Kurt ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008781677     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199012342     Document Type: Article

References (9)

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2. Davies, S. G., Green, M. H. L. & Mingos, D. M. P. (1978). Tetrahedron, 34, 3047-3077.
3. Fagan, P. J., Mahoney, W. S., Calabrese, J. C. & Williams, I. D. (1990). Organometallics, 9, 1843-1852.
4. Gemel, C., Kalt, D., Mereiter, K., Sapunov, V. N., Schmid, R. & Kirchner, K. (1997). Organometallics, 16, 427-433.
5. Gemel, C., Mereiter, K., Schmid, R. & Kirchner, K. (1996). Organometallics, 15, 532-542.
6. Mereiter, K. & Völlenkle, H. (1990). SERVER4, PW115 and LLSQ6. PC Programs for Controlling a PW1100 Four-Circle Diffractometer, for Data Reduction and for Unit-Cell Least-Squares Refinement. Technical University of Vienna, Austria.
7. Sheldrick, G. M. (1976). SHELX76. Program for Crystal Structure Determination. University of Cambridge, England.
8. Sheldrick, G. M. (1997). SHELX97. Program System for the Determination and Refinement of Crystal Structures. University of Göttingen, Germany.
9. Siemens (1994). SHELXTL. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.