Observation of Hot-Hole Injection in NMOS Transistors Using a Modified Floating-Gate Technique

IEEE Transactions on Electron Devices

Volumn 33, Issue 10, 1986, Pages 1529-1534

  Saks, Nelson S ^a   Heremans, Paul L ^b   Van Den Hove, Luc ^b   Maes, Herman E ^b   De Keersmaecker, Roger F ^b   Declerck, Gilbert J ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008780580     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1986.22703     Document Type: Article

References (14)

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