Efficient Mitigation of Edge Effects in Nearest-Neighbor Analysis

Journal of Testing and Evaluation

Volumn 28, Issue 1, 2000, Pages 3-11

  Frost, J David ^a   Saussus, Denis R ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

Edge effects; Image analysis; Nearest neighbor analysis; Packing arrangement

Indexed keywords

EID: 0008774151     PISSN: 00903973     EISSN: None     Source Type: Journal    
DOI: 10.1520/jte12068j     Document Type: Article

References (8)

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