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Volumn 41, Issue 5, 1998, Pages 719-722

High-frequency setup for the emission spectral analysis and smelting of precious metals

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[No Author keywords available]

Indexed keywords


EID: 0008713945     PISSN: 00204412     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (7)
  • 1
    • 27544473070 scopus 로고
    • Light Source for Spectral Analysis
    • RF Patent no. 1 654 677
    • Churilov, G.N. and Ignat'ev, G.F., Light Source for Spectral Analysis, RF Patent no. 1 654 677, Byull. Izobret., 1991, no. 21, p. 168.
    • (1991) Byull. Izobret. , Issue.21 , pp. 168
    • Churilov, G.N.1    Ignat'ev, G.F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.