Proton induced X-ray emission - A tool for non-destructive trace element analysis

Current Science

Volumn 80, Issue 12, 2001, Pages 1542-1549

  Govil, I M ^a  

^a PANJAB UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008679687     PISSN: 00113891     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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