Cavity ringdown measures trace concentrations

Laser Focus World

Volumn 33, Issue 3, 1997, Pages 71-80

  Paul, J B ^a   Scherer, J J ^b   O'Keefe, A ^c   Saykally, R J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c Los Gatos Research Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008623118     PISSN: 10438092     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (13)

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2. For a more detailed discussion of the material presented here and a complete list of references, please refer to the following review articles; J. J. Scherer, J. B. Paul, A. O'Keefe, and R. J. Saykally, Chemical Reviews (in press, 1996); J. J. Scherer et al., Advances in Metal and Semiconductor Clusters, M. A. Duncan, ed., Chapter 4 (JAI Press, Greenwich, CT, 1996); J. J. Scherer et al., Spectrosc. 11, 46 (1996).
3. For a more detailed discussion of the material presented here and a complete list of references, please refer to the following review articles; J. J. Scherer, J. B. Paul, A. O'Keefe, and R. J. Saykally, Chemical Reviews (in press, 1996); J. J. Scherer et al., Advances in Metal and Semiconductor Clusters, M. A. Duncan, ed., Chapter 4 (JAI Press, Greenwich, CT, 1996); J. J. Scherer et al., Spectrosc. 11, 46 (1996).
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