Localization of emission through interpretation of observed Zeeman pattern

Review of Scientific Instruments

Volumn 71, Issue 4, 2000, Pages 1664-1670

  Weaver, J L ^a   Welch, B L ^a   Griem, H R ^a   Terry, J ^b   Lipschultz, B ^b   Pitcher, C S ^b   Wolfe, S ^b   Pappas, D A ^b   Boswell, C ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008620748     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150516     Document Type: Article

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