Analysing the crystal defects of synthetic diamond by the ECP technique of SEM

Journal of Trace and Microprobe Techniques

Volumn 15, Issue 4, 1997, Pages 499-502

  Zhu, Yanyong ^a   Liao, Qianchu ^a  

^a CENTRAL IRON AND STEEL RESEARCH INSTITUTE   (China)

Author keywords

Dislocation density; ECP technique; Etch pit; Intrinsic contrast; Synthetic diamond

Indexed keywords

EID: 0008610427     PISSN: 07334680     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (2)

1. Liao Qianchu (1994) Companion between two kinds of electron optical paths to obtain SACP. Journal of Chinese Electron Microscopy 13, 447.
2. Liao Qianchu (1983) Electron channelling pattern and its application. Metallurgical Industry Publishing House, Beijing, pp.101-104.