Dual in–plane electronic speckle pattern interferometry system with electro–optical switching and phase shifting

Applied Optics

Volumn 38, Issue 4, 1999, Pages 666-673

  Bowe, Brian ^a   Martin, Suzanne ^a   Toal, Vincent ^a   Langhoff, Andreas ^b   Whelan, Maurice ^b  

^a DUBLIN INSTITUTE OF TECHNOLOGY   (Ireland)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008546080     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.000666     Document Type: Article

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