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Volumn 80, Issue 12, 1996, Pages 7104-7107

Characterization of the noise in secondary ion mass spectrometry depth profiles

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0008454745     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363722     Document Type: Article
Times cited : (9)

References (11)
  • 7
    • 0003733873 scopus 로고
    • Prentice Hall PTR, Englewood Cliffs, NJ
    • L. Cohen, Time-Frequency Analysis (Prentice Hall PTR, Englewood Cliffs, NJ, 1995).
    • (1995) Time-Frequency Analysis
    • Cohen, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.