SnO2 Nanocrystalline Thin Films by XPS

Surface Science Spectra

Volumn 7, Issue 2, 2000, Pages 81-85

  Barreca, Davide ^a   Garon, Simona ^b   Tondello, Eugenio ^a   Zanella, Pierino ^b  

^a UNIVERSITY OF PADOVA   (Italy)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHEMICAL VAPOR DEPOSITION; NANOCRYSTALS; SILICA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL VAPOUR DEPOSITION; NANOCRYSTALLINE THIN FILMS; X RAY PHOTOELECTRON SPECTRUM;

ALUMINUM OXIDE;

EID: 0008411596     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/1.1288177     Document Type: Article

References (3)

1. D.Barreca, S.Garon, P.Zanella, and E.Tondello, J. Phys. IV France 9, 667 (1999).
2. J. F.Moulder, W. F.Stickle, P. W.Sobol, and K. D.Bomben, Handbook of X-ray Photoelectron Spectroscopy (Perkin- Elmer, Eden Prairie, MN, 1992).
3. J. A.Taylor, G. M.Lancaster, and G. W.Rabalais, J. Electron Spectrosc. Relat. Phenom. 13, 435 (1978). 10.1016/0368-2048(78)85047-6