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Volumn 3, Issue , 1998, Pages 1427-1428
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Probabilistic robustness: An RLC circuit realization of the truncation phenomenon
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Author keywords
[No Author keywords available]
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Indexed keywords
CLASSICAL ROBUSTNESS;
PHYSICAL REALIZATION;
PROBABILISTIC ROBUSTNESS;
RISK-ADJUSTED;
SAMPLING DISTRIBUTION;
UNCERTAIN PARAMETERS;
UNDERLYING DISTRIBUTION;
UNIFORM DISTRIBUTION;
CONTROL;
ROBUSTNESS (CONTROL SYSTEMS);
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EID: 0008195595
PISSN: 07431619
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ACC.1998.707060 Document Type: Conference Paper |
Times cited : (6)
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References (3)
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