4Pi confocal microscopy with alternate interference

Optics Letters

Volumn 23, Issue 20, 1998, Pages 1567-1569

  Hell, Stefan W ^a   Nagorni, Matthias ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008172672     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.23.001567     Document Type: Article

References (12)

1. S. Hell, "Double-confocal scanning microscope," European patent 0491289 (December 18, 1996); S. Hell and E. H. K. Stelzer, J. Opt. Soc. Am. A 9, 2159 (1992); Opt. Commun. 93, 277 (1992); M. Schrader and S. W. Hell, J. Microsc. 183, 189 (1996); M. Schrader, M. Kozubek, S. W. Hell, and T. Wilson, Opt. Lett. 22, 436 (1997).
2. S. Hell, "Double-confocal scanning microscope," European patent 0491289 (December 18, 1996); S. Hell and E. H. K. Stelzer, J. Opt. Soc. Am. A 9, 2159 (1992); Opt. Commun. 93, 277 (1992); M. Schrader and S. W. Hell, J. Microsc. 183, 189 (1996); M. Schrader, M. Kozubek, S. W. Hell, and T. Wilson, Opt. Lett. 22, 436 (1997).
3. S. Hell, "Double-confocal scanning microscope," European patent 0491289 (December 18, 1996); S. Hell and E. H. K. Stelzer, J. Opt. Soc. Am. A 9, 2159 (1992); Opt. Commun. 93, 277 (1992); M. Schrader and S. W. Hell, J. Microsc. 183, 189 (1996); M. Schrader, M. Kozubek, S. W. Hell, and T. Wilson, Opt. Lett. 22, 436 (1997).
4. S. Hell, "Double-confocal scanning microscope," European patent 0491289 (December 18, 1996); S. Hell and E. H. K. Stelzer, J. Opt. Soc. Am. A 9, 2159 (1992); Opt. Commun. 93, 277 (1992); M. Schrader and S. W. Hell, J. Microsc. 183, 189 (1996); M. Schrader, M. Kozubek, S. W. Hell, and T. Wilson, Opt. Lett. 22, 436 (1997).
5. S. Hell, "Double-confocal scanning microscope," European patent 0491289 (December 18, 1996); S. Hell and E. H. K. Stelzer, J. Opt. Soc. Am. A 9, 2159 (1992); Opt. Commun. 93, 277 (1992); M. Schrader and S. W. Hell, J. Microsc. 183, 189 (1996); M. Schrader, M. Kozubek, S. W. Hell, and T. Wilson, Opt. Lett. 22, 436 (1997).
6. S. W. Hell, M. Schrader, and H. T. M. van der Voort, J. Microsc. 185, 1 (1997).
7. P. E. Hänninen, S. W. Hell, J. Salo, E. Soini, and C. Cremer, Appl. Phys. Lett. 66, 1698 (1995).
8. W. H. Richardson, J. Opt. Soc. Am 62, 55 (1972); L. B. Lucy, Astron. J. 79, 745 (1974).
9. W. H. Richardson, J. Opt. Soc. Am 62, 55 (1972); L. B. Lucy, Astron. J. 79, 745 (1974).
10. W. A. Carrington, R. M. Lynch, E. D. W. Moore, G. Isenberg, K. E. Fogarty, and F. S. Fay, Science 268, 1483 (1995); G. M. P. Van Kempen, L. J. Van Vliet, P. J. Verveer, and H. T. M. van der Voort, J. Microsc. 185, 354 (1997).
11. W. A. Carrington, R. M. Lynch, E. D. W. Moore, G. Isenberg, K. E. Fogarty, and F. S. Fay, Science 268, 1483 (1995); G. M. P. Van Kempen, L. J. Van Vliet, P. J. Verveer, and H. T. M. van der Voort, J. Microsc. 185, 354 (1997).
12. M. Gu and C. J. R. Sheppard, Opt. Commun. 114, 45 (1995).