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Volumn 298, Issue 3, 1998, Pages 763-776
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An intensity/line width analysis of opacity: First applications to a solar prominence and He II line profiles
a b |
Author keywords
Line: profiles; Sun: atmosphere; Sun: prominences; Ultraviolet: stars
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Indexed keywords
SILICON COMPOUNDS;
STARS;
ESCAPE PROBABILITY;
HALFWIDTHS;
INTENSITY LINES;
LINE-WIDTH;
LINE: PROFILES;
OPTICAL THICKNESS;
SOLAR PROMINENCES;
SUN: ATMOSPHERE;
SUN: PROMINENCES;
ULTRAVIOLET: STARS;
OPACITY;
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EID: 0008094273
PISSN: 00358711
EISSN: None
Source Type: Journal
DOI: 10.1046/j.1365-8711.1998.01694.x Document Type: Article |
Times cited : (6)
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References (26)
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