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Volumn 68, Issue 26, 1996, Pages 3829-3831

Organochloride chemically enhanced focused ion beam micromachining of permalloy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0008011404     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116631     Document Type: Article
Times cited : (1)

References (13)
  • 5
    • 21544438007 scopus 로고    scopus 로고
    • H. Ximen and C. G. Talbot, Proceedings of the 20th International Symposium for Testing and Failure Analysis 141, 13 (1994)
    • H. Ximen and C. G. Talbot, Proceedings of the 20th International Symposium for Testing and Failure Analysis 141, 13 (1994).
  • 8
    • 21544480397 scopus 로고    scopus 로고
    • L. T. Romankiw, IBM Thomas J. Watson Research Center, Yorktown Heights, NY
    • L. T. Romankiw, IBM Thomas J. Watson Research Center, Yorktown Heights, NY.
  • 13
    • 21544432542 scopus 로고    scopus 로고
    • Handbook of Chemistry and Physics (CRC, Boca Raton, FL, 1982), 63rd ed
    • Handbook of Chemistry and Physics (CRC, Boca Raton, FL, 1982), 63rd ed.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.