Monte carlo analysis of dose profiles near photon irradiated material interfaces

IEEE Transactions on Nuclear Science

Volumn 22, Issue 6, 1975, Pages 2562-2567

  Garth, J C ^a   Chadsey, W L ^b   Sheppard, R L ^b  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b Science Applications Incorporated McLean ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007962529     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1975.4328168     Document Type: Article

References (6)

1. J. A. Wall and E. A. Burke, “Gamma Dose Distributions At and Near the Interface of Different Materials”, IEEE Trans. Nuc. Sci., NS-17, No. 6, 305-309 (1970).
2. T. A. Dellin, K. W. Dolan, and C. J. MacCallum, “Photo-Compton Currents at Material Interfaces: Theory and Experiment”, IEEE Trans. Nuc. Sci., NS-21, 227-234 (1974).
3. W. L. Chadsey, “Monte Carlo Analyses of X-Ray Transition Zone Dose and Photo-Compton Current”, AFCRL TR-73-0572 (1974).
4. W. L. Chadsey, “X-Ray Produced Charge Deposition and Dose in Dielectrics Near Interfaces Including Space-Charge Field and Conductivity Effects”, IEEE Trans. Nuc. Sci., NS-21, 235-242 (1974).
5. E. Storm and H. I. Israel, “Photon Cross Sections from.001 to 100 MeV for Elements 1 through 100”, LA-3753, LASL (1967).
6. W. L. Chadsey, “POEM: A Fast Monte Carlo Code for the Calculation of X-Ray Photoemission and Transition Zone Dose and Current”, AFCRL TR-75-0324 (1975).