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Zeitschrift fur Kristallographie - New Crystal Structures
Volumn 211, Issue 9, 1996, Pages 641-642
Crystal structure of tetrakis(diphenylamido)zirconium(IV), C48H40N4Zr
Author keywords

[No Author keywords available]
Indexed keywords

EID: 0007929054     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.1996.211.9.641     Document Type: Article
Times cited : (6)
References (4)
  • 1
    • 0027644372 scopus 로고
    • Crystal Handling at Low Temperatures.
    • Kottke, T.; Stalke, D.: Crystal Handling at Low Temperatures. J. Appl. Crystallogr. 26 (1993) 615-619.
    • (1993) J. Appl. Crystallogr. , vol.26 , pp. 615-619
    • Kottke, T.1    Stalke, D.2
  • 2
    • 84980089549 scopus 로고
    • A Semi-Empirical Method of Absorption Correction.
    • North, A. C. T.; Phillips, D. C.; Mathews, F. S.: A Semi-Empirical Method of Absorption Correction. Acta Crystallogr. A24 (1968) 351-359.
    • (1968) Acta Crystallogr. , vol.A24 , pp. 351-359
    • North, A.C.T.1    Phillips, D.C.2    Mathews, F.S.3
  • 3
    • 0003470460 scopus 로고
    • Version 1.6. Molecular Structure Corporation, The Woodlands, TX. 77381, USA
    • TEXSAN: Single Crystal Structure Analysis Software, Version 1.6. Molecular Structure Corporation, The Woodlands, TX. 77381, USA, 1993.
    • (1993) TEXSAN: Single Crystal Structure Analysis Software
  • 4
    • 85025282977 scopus 로고
    • SHELXTL PC.
    • Siemens Analytical X-Ray Instruments Inc., Madison, WI 53719. USA
    • Sheldrick, G. M.: SHELXTL PC. Release 4.1. Siemens Analytical X-Ray Instruments Inc., Madison, WI 53719. USA, 1990.
    • (1990) Release 4.1.
    • Sheldrick, G.M.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.