Modeling the image quality of enhanced reflectance x-ray multilayers as a surface power spectral density filter function

Applied Optics

Volumn 34, Issue 19, 1995, Pages 3715-3726

  Harvey, James E ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; COATINGS; CUTOFF FREQUENCY; IMAGE QUALITY; LINEAR SYSTEMS; OPTICAL MULTILAYERS; POWER SPECTRAL DENSITY; QUALITY CONTROL; REFLECTION; SPECTRAL DENSITY; SURFACE ROUGHNESS;

EVALUATION OF IMAGE QUALITIES; FILTER FUNCTION; HIGH SPATIAL FREQUENCY; HIGH SPATIAL RESOLUTION; MULTI-LAYER-COATING; OPTICAL FABRICATION; SPATIAL FREQUENCY; X-RAY MULTILAYERS;

MULTILAYERS;

EID: 0007912277     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.003715     Document Type: Article

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