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Volumn 34, Issue 9, 1986, Pages 952-964

Transient Analysis of Single and Coupled Lines with Capacitively-Loaded Junctions

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EID: 0007897686     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.1986.1133476     Document Type: Article
Times cited : (25)

References (16)
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  • 2
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  • 3
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  • 6
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  • 10
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    • Coupling effects in the time domain for a interconnecting bus in high-speed GaAs logic circuits
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    • J. Chilo and T. Arnaud, “Coupling effects in the time domain for a interconnecting bus in high-speed GaAs logic circuits,” IEEE Trans. Electron Devices, vol. ED-31, pp. 346–352, Mar. 1984.
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  • 12
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    • W. T. Weeks, “Calculation of coefficient of capacitance of multiconductor transmission lines in the presence of a dielectric interface,” IEEE Trans. Microwave Theory Tech., vol. MTT-18, pp. 35–43, Jan. 1970.
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  • 16
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.