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Volumn 10, Issue 16, 1998, Pages 3479-3488
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Focused ion beam imaging of grains in Al-Li-Cu quasicrystal
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0007883162
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/10/16/002 Document Type: Article |
Times cited : (7)
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References (18)
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