X-ray diffraction and rutherford backscattering spectrometry of Ba1NbxTi1-xO3 thin films synthesized by laser ablation

Journal of Applied Physics

Volumn 86, Issue 4, 1999, Pages 2307-2310

  Nasir Khan, M ^a,b,c   Kim, Hyun Tak ^a   Kusawake, T ^a   Kudo, H ^a   Ohshima, K ^a   Uwe, H ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

^c PAKISTAN INSTITUTE OF NUCLEAR SCIENCE AND TECHNOLOGY   (Pakistan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007809191     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371046     Document Type: Article

References (11)

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