Functional testing and reconfiguration of MIMD machines

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn 1993-January, Issue , 1993, Pages 72-79

  Aktouf, Ch ^a   Robach, Ch ^a   Mazare G ^a   Johansson, J ^a  

^a INPG IMAG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DESIGN FOR TESTABILITY; FAULT TOLERANCE; INTEGRATED CIRCUIT TESTING; PROGRAM DIAGNOSTICS; PROGRAM PROCESSORS;

DISTRIBUTED DIAGNOSIS; FAULT-TOLERANT ROUTING ALGORITHM; FREE CELLS; FUNCTIONAL FAULT MODEL; FUNCTIONAL TESTING; PARALLEL MACHINE; TEST PROGRAM; TESTING PHASE;

SOFTWARE TESTING;

EID: 0007737548     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.1993.595645     Document Type: Conference Paper

References (0)